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Multiposition- Wafer Probe

Jandel Multiposition Wafer Probing System
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    Principal Features

  • 웨이퍼 상에서 1~9 포인트 측정
  • 진공척, 6", 8" 웨이퍼 측정
  • 전류선을 레버로 동작시킴
  • 위치 정확도 +/- 1 mm
  • Jandel Cylindrical probe head  

 

Operating instructions for the Multiposition Wafer Probe - 6" model

Operating instructions for the Multiposition Wafer Probe - 8" model


                                                                                    Tel 031-479-4211/2

Fax 031-479-4213

          Email JSi@JSiTS.com